IEC 60749-8 pdf download Semiconductor devices – Mechanical and climatic test methods – Part 8: Sealing
1 Scope and object
This part of lEC 60749 is applicable to semiconductor devices (discrete devices andintegrated circuits)
The object of this test method is to determine the leak rate of semiconductor devices.
NOTE This test is identical to the test method contained in clause 5 of chapter 3 of IEC 60749 (1996), amendment2, apart from the addition of this clause and clause 2 and the subsequent renumbering.
The following referenced documents are indispensable for the application of this document.For dated references, only the edition cited applies.For undated references, the latest editionof the referenced document (including any amendments) applies.
IEC 60068-2-17:1994,Environmental testing – Part 2: Tests- Test Q: Sealing
3.1 Units of pressure
The International System of Units (Sl) recommends the use of the Pascal (Pa) as the unit ofpressure.The commonly used units are, however, the absolute atmosphere or the bar (where1 absolute atmosphere = 1 bar = 105 Pa).The unit used in this test method is the Pascal withthe bar used as an alternative.
3.2Standard leak rate
The standard leak rate is defined as that quantity of dry air at 25 °C in pascals(bars) cubiccentimeters flowing through a leak or multiple leak paths per second when the high-pressureside is at 105 Pa (1 bar) and the low-pressure side is at a pressure of not greater than 102 Pa(10-3 bar).The standard leak rate shall be expressed in units of pascals cubic centimetresper second (bars cubic centimetres per second).
3.3 Measured leak rate
The measured leak rate R(He) is defined as the leak rate of a given package as measuredunder specified conditions and employing a specified test medium. The measured leak rateshall be expressed in units of pascals cubic centimetres per second (bars cubic centimetresper second). For the purpose of comparison with rates determined by other methods oftesting, the measured leak rates must be converted to equivalent standard leak rates.
3.4 Equivalent standard leak rate The equivalent standard leak rate (L) of a given package, with a measured leak rate R (He) , is defined as the leak rate of the same package with the same leak geometry, that would exist under the standard conditions of 3.2. The formula in 6.3 (which does not apply to test condition 5) represents the L/R ratio and gives the equivalent standard leak rate (L) of the package with a measured leak rate R (He) , where the package volume and leak test conditioning parameters influence the measured value of R (He) . The equivalent standard leak rate shall be expressed in units of units of pascals cubic centimetres per second (bars cubic centimeters per second).